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    (

    II A

    It

     I

    J<

    H 2

     

    4iii; i t

    t

    , ~ j . , , ' M I I t f . I : ~ ~ ' I ' : . . .

    l hc Failure

    Distribution

    Thl initial focus of this book is on lhe developme nt of mathematical models that de

    ~ n i h e

    the reliability of components and systems. This chapter develops four related

    plOhability functions: the reliability function, the cumulative distribution function,

    11ll probability density function, and the hazard rate function.

    Each

    of these func

    I ions can be used

    to

    compute reliabililies, but they offer four different perspectives.

    Specifying anyone of these functions will uniquely and completely characterize the

    lailure process. Various summary measures

    of

    reliability, such as the mean time to

    failure, the variance of the failure distribution, and the median time to failure, may

    then be determined. Subsequent chaplers will define several common and highly

    useful theoretical reliability models.

    2.1

    THE RELI BILITY FUNCTION

    Reliability is defined as the probability that a system component) will function over

    -;ome time period t. To express this relationship mathematically we define the contin

    uous random variable to be the time

    to

    failure of the system component);

    O.

    Then reliability can be expressed as

    R t) = Pr{T t}

    2.1 )

    where R t) 2: 0, R O) =

    1,

    and limHoo

    R t) O.

    For a given value of

    t R t)

    is the

    probability that the time to failure is greater than or equal

    to t

    If we define

    F t) R t)

    = Pr{T

    <

    t}

    2.2)

    23

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    ---------------------

    ARl I: Bask

    Reliability Models

    where

    £(0)

    = 0

    and

    l imF t) =

    I

    I

    '"

    then F t) is the probability that a failure occurs before time I.

    We will refer to R(t) as the reliability function and

    F(t)

    as the cumulative dis-

    tributionfunction COP) of

    the failure distribution.

    A

    third function, defined by

    f(t) = dF(t) = _ dR(t)

    2.3)

    dt dl

    is called the

    probability density fun tion

    (PDP).

    This

    function describes the shape

    of

    the

    failure distribution. These three functions are illustrated in Pig. 2.1.

    The

    PDP,

    I(t).

    bas these two properties:

    oo

    f(t) : :

    0 and

    f(t) dt

    = I

    Given the PDP, f(t), then

    F(t) = f(t ) dt

    (2.4)

    and

    R(t) = f f(t ) dt

    2.5)

    In other words, both the reliability function and the COP represent areas under the

    curve defined

    by f(t).

    Therefore. since the area beneath the entir e curve is equal to

    one, both the reliability and the failure probability will be defined so that

    o s; R(t) s;

    lOs F t)

    s; 1

    The function

    R(t)

    is normally used when reliabilities are being computed, and the

    function

    F t)

    is normally used

    when

    failure probabilities are

    being

    computed. Graph

    ing the PDP,

    f(t),

    provides a visual representation of the failure distribution.

    EXAMPLE 2.1. Given the following PDP for the random variable T, the time (in op

    erating hours) to failure of a compressor, what is its reliability for a lOO-hr operating

    life?

    Solution

    0.001

    [ I) =

    ci0 OOlt +

    1)2

    {

    otherwise

    Solution

    R f' 0.001 d I

    1

    00

    t) t (O.OOlt + 1)2 t '= (O.OOlt + 1) t O.OOlt +

    1

    I O.OOlr

    and

    F t) = 1 -

    R t)

    = I

    O.OOlt

    + I 0.0011 + 1

    hen

    ROOO) =

    0.1

    1

    + I = 0.909

    1M

    a)

    1"(1)

    -

    III -

     

    -

     b)

    ( I)

    Area

    =

    1.0

    e)

    FIGURE

    2.1

    a) The reliability function. b) The cumulative distribution function.

    c)

    The probability density function.

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    26 "AM'!' I. BusicReliuhililyModels

    A designlifeisdefinedto

    be

    thetimeto failure tR thatcorresponds to aspecifiedrehabi!

    ityR. ThatisR tR) =

    R.

    Tofindthedesignlifeifareliability

    of

    0.95isdesired,wesel

    1

    R tR) = =0.95

    Solvingfor

    td,

    tR 1 0 0 0 0 . ~ 5 - 1 52.6hr

    Theprobability

    of

    afailureoccurringwithinsomeinterval

    of

    time

    [a,

    b) maybe

    foundusingany

    of

    thethreeprobabilityfunctions,since

    Prf a T

    s

    b}

    =

    F(b) - F(a)

    =

    R(a) R(b)

    r

    f ( t )dt 2.6)

    Fromthepreviousexample,

    Pr{

    10

    s

    T

    s lOO}

    =R(lO) R lOO)

    0.1 + I = 0.081

    2.2

    MEANTIMETOFAILURE

    Themeantimetofailure(MTTF)isdefinedby

    '

    MTTF=E T) =

    tf(t)dt

    (2.7)

    whichis themean,orexpectedvalue,

    of

    theprobabilitydistributiondefinedby f 1).

    It canalsobeshown(Appendix2A)that

    MTTF=tOO R(t) dt 2.8)

    Equation(2.8)isofteneasierto applythan(2.7).

    Themeanof thefailuredistributionisonlyoneof severalmeasures

    of

    central

    tendencyof thefailuredistribution.Anotheristhemediantime to failure,definedby

    R tmed)

    =

    0.5

    =

    Prf T ;;:::

    tmed}

    (2.9)

    Themediandivides thedistributioninto two halves, with50 percentof the fail

    uresoccurringbeforethemediantimeto failureand

    50

    percentoccurringafterthe

    median.Themedian maybepreferredto themeanwhen thedistributionishighly

    skewed.

    Athirdfrequentlyusedaverageisthemode,ormostlikelyobservedfailure

    time,definedby

    f(tmode) = max f(t)

    (2.10)

    OSI

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    Ind (or R2(t),

    R2(400) = l ( X ~ ~ 4 0 0 ==

    0.60

    Obviously,

    the

    MITF

    alone win not uniquely characterize a failure distribution.

    Other measures are necessary. One measure that is often used to further describe

    a

    failure distribution is its variance (1'2, defined

    by

    (1'2

    =

    L"'(t-MITF)2f(t)dt (2.11)

    The variance represents an average squared distance a failure time will be from the

    MITF.

    It is a measure

    of

    the spread, or dispersion,

    of

    the failure times about the

    mean.

    It

    is shown in Appendix

    2B

    that the variance can also be written as

    (1'2

    =

    fa' t

    2

    f(t)dt - (MTTF)2 (2.12)

    Equation

    (2.12)

    is computationally simpler than the definitional Eq.

    (2.11).

    \

    The

    square root of the variance is the standard .deviation. Since the standard deviation

    will be measured in the same time units as the random variable, T, it. is

    easier

    to

    interpret than the variance (which is m easured in square units).

    EXAMPLE

    l.4.From the first failure distribution in Example 2.3,

    we

    have

    2

    17 ==

    fo' t

    2

    (0.002e-

    o

    .

    O2J

    )dt

    -

    (500)2

    =

    250,000

    and 17

    =

    500.

    From the second. with f(t)

    =

    -dR(t)Jdt = 111000,

    17

    2

    fOOO 2 l ~

    )dt -

    (500f

    1000

    3

    1

    .

    = 0 -

    (500)2

    =

    83,333

    and

    17 =

    288.67.

    Therefore, although their

    MTIFs

    are identical, they have considerably different

    standard deviations. from which we would conclude that their reliability distributions

    should

    be

    inherently different. We would generally prefer the distribution having the

    smaller variance. Why?

    HAZARD RATE FUNCTION

    In addition to the probability functions defined earlier, another function, called the

    failure rate

    or

    hazard rate Junction,

    is often used

    in

    reliability. It provides an instan

    taneous (at time t) rate of failure. From Eq. (2.6),

    Pr{ t

    s

    T

    :::.:;

    t

    +

    Ill} = R(t) - R(t

    +

    Ilt)

    an(.!

    the conditional probability of a failure in the time interval from

    t

    to t

    +

    Ilt given

    t h a ~ the system nas survIved to time t is

    Pr\

    t

    s

    l

    s

    t + At 1T 2: I -

    R(I)

      t ~ . -

    Thon

    R(t) - R(t +

    Ilt)

    R(t) III

    III the conditional probability

    of

    failure per unit

    of

    time (failure rate).

    Set

    A(O = lim =[R(t

    +

    Ilt)

    - R(tli .

    _1_

    Al

    -..0

    Ilt R(t )

    (2.13)

    -dR(t) 1 f(t)

      ;

    ---;rr .

    R(t)

    =::

    R ij

    Then

    A(t) is known as the instantaneous hazard rate

    or

    failure rate function.

    The

    I'llilure rate function A(t) provides an alternative way

    of

    describing a failure distribu

    (ion. Failure rates

    in

    some cases may be characterized as increasing (IFR), decreas

    ing DFR), or constant

    eFR)

    when A I) is an increasing, decreasing,

    or

    constant

    funclion.

    A

    particular hazard rate function will uniquely determine a reliability function.

    To see this, let

    -dR(t)

    1

    A(t)

    dt

    ,-, . R(t):

    -dR(t)

    A(t)dt

    ==

    I f ( i )

    or

    lntegrating,

    t

    ,  

    JR t)

    : S ..')

    J

    A(t )dt - I R(t')

    1 establishes the lower limit

    in the

    integral on

    the

    right-hand side.

    where R O)

    ==

    Then

    -L(t )dr =

    In

    R(t)

    (2.1,t)

    .ot

    R(I)

    exp

    l

    L

    (I')

    d

    t

    1

    Equation (2.14) can then

    be

    used to derive the reliability function from a known

    hazard rate function.

    EXAMPLE 2.5. Given the linear hazard rate function

    A(t)

    = 5

    X

    O 6

    t

    where t is mea

    sured in operating hours, what is the design life

    if

    a 0.98 reliability is desired?

    Solution

    R(t) P

    l l:

    5

    x

    W .

    d 1

    «P

    [ - 2.5 x

    \0"','

    1

    0.98

    2.3

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    J

    In 0.98 = 89.89' 90

    hr

    or

    10 98

    =

    umulative and average failure rate

    The cumulative failure rate over a period

    of

    time t is defined

    by

    L(t)

    =

    f; A(t')

    dt

    (2.15)

    A related and useful concept is the average failure rate, defined between two times

    tl and

    t2:

    AFR(tl,

    t2)

    1

    J'

    2

    A(t )dt =

    InR(tI) - nR( t2)

    (2.16)

    t2 -

    tIl l

    t2 - t)

    FromEq.(2.l4)andlettingtl

    =

    Oandt2

    =

    T,Eq.(2.l6)maybewritten

    AFR(t) =

    In R O) - In

    R t) =

    --

    In R t)

    L t)

    since In

    R O)

    In

    1

    = O.

    If

    AFR t)

    is a nondecreasing function, the failure distribution is characterized

    as having an increasing failure rate average (IFRA). I f the function is nonincreasing,

    the distribution has a DFRA. Obviously IFR (DFR) systems are also IFRA (DFRA),

    but the Converse is not necessarily true.

    EXAMPLE 2.5 (CONTINUED). The cumulative failure rate is given by

    L(t) = {' 5

    x

    to-

    6

    t dt 2.5

    x

    lO6 (2

    Jo

    .

    and the average failure rate from time 0 to t is

    6

    2

    AFR t) 2.5

    X

    10--

    t =

    2.5 x 10-

    6

    t

    t

    EXA

    MPLE

    2.6. A component has a reliability function gi ven by

    t

    2

    R(t) 1 - 2 for 0 t a

    a

    where a is a parameter of the distribution representing the component's maximum life.

    Then

    2

    f(t) = 2t

    A(t) = 2tla = _2_t_

    and

    forO t a

    a

    2

    t

    2

     a

    2

    t

    2

    )l a

    2

    2 3

    t ) t IQ

    = aMTTF

    =

    i

    Q

     

    1 - - dt =

    t

    -

    a

    2

    o 3a

    2

    0 3

    t

    2

    m ~ d = 0.5; tmed

    "r0.5a

    2

    0.707a

    a

    AFR t)

    =

    -In(1

    -

    t

    2

    1a

    2

    )

    t

    The average failure rate up

    to

    the MTTF is

    AFR(MTTF) = AFRG a =

    In 1

    -  4I:1

    a

    )/

      ~ a )

    = 0.8:17

    ).(1)

    Wearou[

    Uscfullifc

    Hum-in

    I ;

    do

    m failures I ;

    Ran

    I

    Early \

    I

    '"

    ...  failures

    I

    :_ Wearout

    :

    - - , f ,l i, re '

    • •

    I

     

    ............................

    _.;

      ..........

    FIGURE 2.3

    The bathtub curve.

    2 4

    n THTUB URVE

    All important form

    of

    the hazard rate function is shown in Fig. 2.3. Because of its

    shape, it is commonly referred to as the bathtub

    curve.

    Systems having this haz

    ard rate function experience decreasing failure rates early in their life cycle (infant

    mortality), followed by a nearly constant failure rate (useful life), followed by an

    increasing failure rate (wearout). This curve may

    be

    obtained, as shown later, as a

    composite of several failure distributions, or as shown in the following example, as

    u function

    of

    piecewise linear and constant failure rates. Table 2.1 summarizes some

    lit' the distinguishing features of the bathtub curve.

    EXAMPLE 2.7. A simplified form ofthe bathtub curve is based upon lin ear and constant

    hazard rates:

    o

    t Co

    Cit + A

    CI

    Co

    < t to

    CI

    A t)

    C2 t

    - to)

    +

    A

    to <

    t

    Then

    o t s Co

    exp - (co + A)t Cj(P/2)j

    CI

    Co

    < t

    to

    c2 )

    CI

    R(t)

    = \ exp At

    +

    exp [( {)(t - to> + At + ] t < f

    where Co' CI,

    C2.

    and to are constants to

    be

    determined. Figure 2.4 portrays this hazard

    rate graphically. Appendix 2D derives R(t) from A(I).

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    TA

    B t

    It

    2. '

    The bathtubcurve

    Characterizedby

    Causedby Reducedby

    Bum-in

    DFR

    Manufacturingdefects: Burn-intesting

    weldingflaws,cracks, .

    Screening

    defective parts,

    Quality control

    poorqualitycontrol, Acceptancetesting

    contamination,poor

    workmanship

    Usefullife

    CFR

    Environment

    Redundancy

    Random loads Excessstrength

    Human error

    "Acts of God"

    Chanceevents

    Wear-out IFR

    Fatigue

    Derating

    Corrosion Preventivemaintenance

    Aging

    Partsreplacement

    Friction Technology

    Cyclicalloading

    2.5

    CONDITIONALRELIABILITY

    Conditionalreliabilityisusefulindescribingthereliability

    of

    acomponentorsystem

    followingabum-inperiod

    To

    orafterawarrantyperiodTo. Wedefineconditional

    reliabilityasthereliabilityof asystemgiventhat

    it

    hasoperatedfortimeTo:

    5

    4

    3

    2

    2.41 3.21 4.01

    4.81 5.61

    Time

    FIGURE2.4

    Apiecewiselinearbathtubcurve.

    R(I\

    To PI (

    7'

    ,.

    1'0

    + t iT ;> Tol

    R(To + t)

    Prl

    T:>To+

    t\

    - ~ , , - :

    R(To)

    Pr \T>To

    \

    (2.17)

    :::

    ex

    p

    [ -  OTo+t

    A(tl)dtIJ

    ex [

    ro A(t )dt ]

    "'+  ::" W)dt 1

    p

    EXAMPLE 2.8.

    Let

    -0.5

    0.5

    t

    t inyears

    A t) = 1000Cooo

    )

    whichis \l. DFR.Thenfrom

    Eq.

    (2.14),forareliabilityof

    0.90

    t 112

    R(t) == exp - 1000

    =

    0.90

    (

    andthedesignlifeisfoundfrom

    t

    == lOOO(-1nO.90)2 ILl yr

    If

    we letTo = 0.5,asix-monthbum-inperiod,then

    R IT

    =R(t

    + 0.5)

    t

    0

    R 0.5)

    =

    exp- I +

    0 . 5 ) 1 H ~ 1 ° . 5 _

    0.90

    exp- (0.511

    oooj'

    r  05 \ . 51

    t

    =

    lOOOl-lno.90+ yX {» -0.5

    =

    ~ s y r

    and

    Thisis

    an

    increaseofover4yearsinthedesignlifeasaresultofasix-monthbum-in

    period.This improvementin reliabilityresultingfrom a bum-in periodTo willonly

    be realized fora DFR asillustrated in the following example and shown in Ap

    pendix2C.

    EXAMPLE 2.9.

    Let

    A(t)

    =

    At,

    an

    IFR

    for

    A> O.

    Then

    R(t)

    = e-(lI2)M

    2

    -(lJ2»).

    (1+

    TO)2

    e

    R(t \To) = -(II2)Uij

    and

    e

    which.canbesimplifiedto

    2

    R(t I

    To). ;:;

    e -

    ATo

    'e-(II2)Al

    Sinceexp(_ ATo t for)..> 0isadecreasingfunctionof To. theconditionalreliability

    willdecreaseasthebum-inperiod

    To increases.

    http:///reader/full/lOOOl-lno.90http:///reader/full/lOOOl-lno.90http:///reader/full/lOOOl-lno.90

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    EX M1'1.E Z. 10. Forthl.' reliabilityfunction giyeninExample2.6.thecondit IlInlll ..l:'Ii-

    abilityis

    Nit

    I

    To) = I

    (t +

    To)2/a

    2

    a

    2

    -

    (t

    +

    I

    T51a2 T2

    o

    2

    Residual

    MTTF

    Since R(t ITo) isareliabilityfunction,aresidualMTTF maybeomained from

    x R( t ) . ,

    I

    MTTF(To) r R(t ITo)dt =

    R(T ) dt = R(To)

    I R(t')

    dt' (2.18)

    .10

    o

    where

    t'

    =

    I

    +

    To.

    For

    thoseunitshavingsurvivedtotime

    To,

    Eq.(2.18)determines

    theirmeanremaininglifetime.Forcomponentshavingan IFR (DFR). one would

    expect

    the

    MTIF(To) to

    beadecreasing(increasing)functionof

    To.

    asshowninthe

    followingexamples.

    EXAMPLE 2.11. Thereliabilityt"unctionR t) IJ

    I)lbforO:s

    t :s

    bandzemelse-

    wherehasanlFR(seeExercise

    2.8).

    lis residual MTTF isgivenby

    h b 1')2

    (b To)

    MTTF(T

    o

    )   ~ h ~ O )

    - To

    forO

    °

    saparameter(constant)of thedistribution,has[hehazardrate lun,:

    ;'

    ..,

    ACt =

    a

    + f

    whichisdecreasing. I'heresidualMTTF is

    -a

    2

    . T 2 I ·

    ,

    MTTF(T )

    (a

    T 0)

    dt'

    a

    t

    To

    o

    To

    a

    + t ):

    a + t'

    whichhastheinterestingproperty!!lattheresidualmeanincreaseshytheamount

    of

    the

    currentage.If

    To

    = 0,theunconditionalmean,MTTF =a, isohtained.

    2.6

    S(JMMARY

    A

    failureprocess.rep resented bythe random variableT (time tofailure),may be

    1Illi'luely

    characterizedbyanyof thefollowingfourfunctions:

    I. lUI. theprobahilitydensityfunction(PDF)

    2. ' (1). the

    cumulative

    distributionfunction

    (CDF)

    J.

    /((1),

    thereliabilityfunction

    4. ).(1),thehazardratefunction

    ~ ~ ~ ~ ~

     

    . .

    Tht

    following

    relutionllhlllM hili".

    R(t) =

    r'

    f(t') dt '

    '.'(1) \./ f(t ' )dt '

    .0

    f(t) = -dR(t ) = dF(t)

    R(t) =1 - F(t) dt

    A t)

    =  J l

    R t)

    R(t) exp [ i: A(t')dt'l

    MTIF

    J:

    R(t)dt

    oo

    (T

    2

    t

    2

    f(t) dt (MTTF)2

    R(t I To)

    !!(t + T o ~

    R(To)

    L(t) = 1/ A(t') dt'

    o

    12 A(t)dt In In

    R(h)

    AFR(t\.

    t2)

    t2

    - t\

    t2

    -

    tl

    R(/') dt '

    MTTF(To)

    = R(To)

    APPENDIX2A

    DERIVATION

    OF

    EQUATION(2.8)

    By

    definition.

    MTTF = t

    f(t)

    dt

    FromEq.(2.3),

    MTIF J oo dR(t)

    -T t

    tdt

    o

    Using integrationby parts,

    MTTF -tR(t)1' +

    foo

    R(n

    d

    !

    (2.8)

    10 0

    MTIF =

    J:

    R(t)

    dt

    · ---- ''''''',T

    ...... ~ , . .

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    ~ l I l c e

    lim

    t

    R(t) = lim

    te x

    p

    [

    rA(t')dt'j

    0

    I-+::n l - ~ Jo

    and

    O'R(O)

    ==

    0

    APPENDIX 28

    DERIVATION OF EQUATION

    (2.12)

    [J.2

    f (t -MITFi

    J(t)dt

    == LX> [p

    -

      t

    .

    MITF +

    (MITFi]

    J(t) dt

    2

    r t

    f( t)dt 2MTTFJ: t f t )d t

    + (MTIF)'

    J: f(t)dt

    =

    10'

    P

    J(t)dt

    - 2(MITF)2

    +

    (MTTF)2

    since

    LX> tJ(t)dt == MTTF

    and

    LX> JCt)dt

    I

    Therefore

    (T2 == L t

    2

    J(t)dt

    - (MITF)2

    (2.12)

    APPKNUfX 2C

    CONUI'f'IONAL RELIABILITY

    ND

    ItAltURE RATES

    _1Iq, (2.17),

    R(T, + t) [(t+TO 1

    H(t I To)

    R(°"j;;) ==

    exp -

    JTo

    .

    A(t

    '

    )dt'

    l'IIAI'II'1l ."

    'I'hl:

    1101111111:

    l l i ~ l l h l l l l o l l 1'1

    d IW

    I

    To) I J J I

    j

    d

    (: t

    Mt')

    dr'

    j

    IIWH,ton' /' , cxp

    I

    AU

    I

    )dr /'"

    l 10

    1' (

    0

    N(t ITo)

    AU

    + To) + A(To)]

    III o,der

    r r

    the reliability

    to

    improve as a function of

    To,

    the derivative, or slope.

    nl

    I\(

    r I 'I 'l l ) with respect to Ttl must be positive. From the above result, this will occur

    I I l Ih II A(fl l ) .

    AU

    i {o). ln

    other words, the failure rate must be decreasing,

    r\PIJENDIX 2D

    INTI':R!\lEDIATE CALCULATIONS

    !iOa TilE

    LINEAR

    BATHTUB

    ClJRVE

    •.

    __ _ . u ; ' ; ' ~

    h" r .

    rT

    R(t\ =-

    exp

    [

    Jo

    A)dt']

    2

    exp-(cot

    -

    2

    l

    t

    +

    [

    hlll ' I l < I "

    'II:

    R(I)

    R cxp

    (

    ('1)

    c, .

    A

    (

    xp -

    ( I

    +

    j

    co)

      cxp

    CI

    (

    At Aco)

    CI

    cxp

    (At + 2('1 )

    For

    to

    t:

    ' [c2(t' (0) + A1dlt1

    = exp - (Ato

    +

    ) exp

    ;

    r 10)2

    + At

    - Ato)

    R(t) R(lo)exp

    C1

    EXP -

    i (t ,

    + At 2e )

    (

    l

    M n t I ~ i

    . .

    ......

    ........ ..,

     

    .,

    ..

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    9/18

    .. _, .

     

    APPENDIX2E

    TABLEOFINTEGRALS

    2E.l

    INDEFINITEINTEGRALS

    l.

    J

    adt

    =at

    2.

    R

    1

    J

    t +

    ¥

    ndt

    =

      -

    n + 1

    3,

    J

    Int

    eat

    .

    Je

    l

    [

    dl

    a

    5.

    (a + bt)n+l

    J

    a + bt)R dt =

    n ¥

    n + l)b

    6.

    J

    ear

    teat dt = a

    2

    (at

    1)

    7.

    J

    udv

    =

    uv -

    J

    vdu

    (integrationbyparts)

    2E.2

    DEFINITEINTEGRALS

    8.

    J(,' te-at

    dt =

    a>

    0

    9.

    f

    -aid _ n.

     

    a>

    0

     

    t e

    . . .

    o a

    n

    +

    I n aposItiveInteger

    £XERCISES

    2.1

    COllSiderthefollowingreliabilityfunction,where

    t

    is inhours:

    1

    R t) O.OOlt +

    1

    t

    ;;= 0

    (a) Find thereliabilityafter 100operatinghours;after1000operatinghours.

    (b)Derivethehazardratefunction.

    Is

    itan increasingoradecreasingfailurerate?

    _

    ACOIIII)UIlt'nt hasIhefllllowlIIglinellrhazard!"dIe, where

    t

    isinyears:

    A t) OAt 0

    (II)

    Find

    N t) anddetennine theprobabilityof acomponent f

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    10/18

    (d) Is thefailurerateOFR,CFR,orIFR'!

    (e) Willaone-yearbum-inperiodimprovethereliabilityin part(a)?If so,whatisthe

    newreliability?

    2.8

    A umfonn failuredistributionhasthecharacteristicthatequalintervalsof timehave

    equalfailureprobabilities.Thedensityfunctionisgiven by

    I

    f t)

    = - 0   =; t =;

    b

    b

    Analyzethisgeneralfailuredistributionbyfinding

    F t \

    R t), A t), MTIF, Tmod,Tmode,

    andu.

    2.9

    RepeatExercise

    2.8

    assumingthatb

    =

    20

    yr.

    2.10 Thereliabilityof aturbinebladecartbe representedbythefollowing:

    R t) =

     I - r 0  =;

    t

    =;

    t

    where

    t

    isthemaximumlifeoftheblade.

    (a) Showthatthebladesareexperi encingwearout.

    (b) ComputetheMTIF as afunctionof themaximumlife.

    (c)

    If

    themaximumlifeis2000operatinghours,whatisthedesignlifeforareliability

    of 0.901

    2.11 Anew fuelinjectionsystemisexperiencinghighfailurerates. The reliabilityfunction

    hasbeenfound to be

      t + 0-

    3

    R t) =

    t

    2

    0

    where

    t

    ismeasuredin years.The reliabilityoveritsintendedlifeof 2

    yr

    is0.19,which

    isunacceptable.Willabum-inperiod

    of

    6monthssignificantlyimproveuponthisreli

    ability?

    If

    so,byhowmuch?

    2.12 UsingEq. (2.14),derivethereliabilityfunctionforasystemhavingalinearlyincreasing

    hazardratefunction,i.e., A=

    at, a > 0, t

    2

    O

    Findthedensityfunction, and derive

    expressionsforthemediantimetofailureandthemode.

    2.13 ComputetheaveragefailurerateforthefailuredistributioninExercise2.4.Whatisthe

    averagefailurerateoverthefirst500 hours?

    1.14 A

    householdappliance

    is

    advertisedash avingmorethan alO-yrlife.If thefollowing

    is

    itsPDF,determineitsreliabilityforthenext10

    yr

    if it hassurviveda l-yr warranty

    period:

    f t) 0.10 + 0.05t)-3 t

    2

    0

    Whatisits

    MTIF

    beforethewarrantyperiod,andwhatisits

    MTIF

    afterthewarranty

    IIcriodassumingithasstillsurvived?

    IIJI Mhllw thatif thehazardratefunctionisdecreasing,thePDF, f t) , isalsoadecreasing

    l\anctionanditsmodemustthereforeoccurat

    t =

    O.

    l

    ' I II

    ' II

    f'(O and R t) whenthehazardratefunctionisexponentiaLThat is,A(t)

    =

    ae

    ,

    wh.".

    /I

    is aconstantanda

    >

    O. Thisisonefonn of anextremevaluedistribution

      hili heenused to modelwearoutduetocorrosion. It isalsoknown as Gumbel's

    .' hudlln.

    ( II

    ,,','1': It .\

    'M I •

    .......

      -

    , . . . , . . , . .

    ..... - ...

    , , "

    ConstantFailureRateModel

    These nexttwochapterswilldevelopseveralprobabilitymodelsusefulindescrib

    ingafailureprocess.Thesemodelsarebasedupontheexponential,Weibull,normal,

    andlognormalprobabilitydistributions.Theyareoftenreferred toastheoreticaldis

    tributionssincethey arederivedmathematicallyandnotempirically.Animportant

    question

    to

    beansweredisthatoftheabilityofaparticulartheoreticaldistribution

    to u.escribe the failures andreliability ofacomponentora system.The answerto

    thatquestion

    is

    acentralthemeinPart

    11

    ofthetext.The immediateconcern,how

    ever, is thedevelopmentanduseofthesetheoreticalmodelsinanalyzingafailure

    process. .

    Afailure distribution thathas aconstant failure rate

    is

    calledan

    exponential

    probability distribution, Theexponentialdistributionisoneof themostimportant

    reliabilitydistributions.Manysystemsexhibitconstantfailurerates,and,theexpo

    nential distribution

    is

    inmanyrespects thesimplestreliabilitydistribution

    to

    ana

    lyze. Another usefulconcept,failuremodes,

    is

    also discussed.If thefailure rates

    of

    allfailuremodesofacomponentareconstantandindependent,thentheoverall

    failurerateofthecomponentisalsoconstant.

    3.1

    THE

    EXPONENTIALRELIABILITYFUNCTION

    Oneofthemostcommonfailuredistributionsinreliabilityengineeringistheexpo

    nential,

    Of

    CFR,model.failures due to completelyrandom orchance eventswill

    followthisdistribution.

    It

    shoulddominateduringtheusefullifeofasystemorcom

    ponent.It isalsooneoftheeasiestdistributionsto analyzestatistically.Forexample.

    4l

    '_111

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    gOlld parametcr cstimators and cxact conlidcnce intervals call bc cm,ily computed

    under differcnt testing conditions (e.g., in the presence of censoring). r

    We begin the development of the CFR model by assuming that

    A t) =

    A,

    t

    0,

    A> O. Then from Eq. (2.14)

    R(t)

    =

    exp/-

    fa Adtl] =

    e-

    At

    , t

    2:

    0

    (3.1 )

    and

    F(t) = 1 - e-

    At

    Then

    J( t )

    .

    .

    -

    dR(t)

    =

    Ae -

    At

    dt

    The

    three probability functions are illustrated graphically in Fig. 3.1 for several dlf ..

    ferent values of

    A.

    To find the

    MITF.

    we use

    Eq.

    (2.8):

    f

    a

    e-

    At

    dt

    e-AtJ'oo 1

    MTTF

    =

    = _

      _

    o A

    A

    3.2)

    o

    The variance is given by Eq. (2.11), or

    2

    (7 2

    I -At

    - -

    Ae

    dt

    -

    A

    )

    A2

    (3.3)

    and the standard deviation is

    A MITF.

    This is an interesting result since it im

    plies that the variabilityof failure time increases as the reliability MITF) increases.

    R(t)

    1 2 ~

    I

    1.0

    0.8

    0 [

    0.4

    0.2

    o

    0.5

    1.0

    r

    ,

    \

    "

    till

    .25 -

    1.00

    5.00 -

     

    1.5

    2.0

    2.5

    3.0

    3.5

    4.0

    (a)

    FIGURE

    3.1

    (a) The exponential reliability function.

    I

    Censoring will

    be

    discussed later. It requires the analysis of incomplete failure dam (not all items tested

    have failed).

    F .)

    1.2

    10

    0.8

    0.6

    '

    0.4

    0.2

    0.25

    1.00

    5.0 1

    A.

    o

    0.5 1.0

    1.5 2.0 2.5 3.0 3.5

    (b)

    f(t)

    6

    5

    A

    .0

    2.5

     

    r

    5.0

    3

    2

    '

     

    .

    ......

    ': -

      .-

    ······ •..7.··:-:.':":.":".:" '.':'":..'"r"._._._.

    o

    0.5

    1.5

    (e)

    FIGURE 3.1

    continued)

    The exponential cumulative distribution function. c) The exponyntial

    probability densitv function.

    High variability in failure times is often observed in practice. It should also be noted

    that the mean time to failure is the reciprocal of the failure rate. Although

    AU)

    is

    always in units of time per (between) failures, it is the mean ofthe failure distribution

    for the

    CFR

    model only.

    A second observation concerning this distribution is that

    R MTTF) e MTIFIMTIF = e-

    I

    0.368

    2

    ...

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    A

    component having

    a

    CFR has

    a slightly better than one-third

    chance

    of

    surviving

    to its

    mean time

    to failure.

    The design

    life of a

    component having an

    exponentially

    distributed failure

    time may be obtained

    by solving for

    the

    inverse of

    the

    reliability

    function. That is, for a

    given

    reliability

    R,

    e-

     t

    R(tR)

    =

    R

    then

    1

      ln

    A

    (3.4)

    When R

    =

    0.5, the

    median of

    the distribution

    is

    obtained from Eq. (3.4):

    Imed

    -

    -

    _ 1

    I

    05

    An .

    0.69315

    (3.5)

    = 0.69315 MTTF

    The

    median is always

    less

    than

    the

    mean

    since

    the exponential

    distribution is skewed

    to the right.

    EXAMPLE 3 t A microwave transmitter has exhibited a constant failure rate of

    0.00034 failure per operating hour. Therefore MTIF

    1/0.00034 =

    2941

    hr

    and

    tmcd

    0.69315

    X

    2941

    =

    2039 hr. The reliability function

    is

    given by

    R(t)

    = e-O.OOO34t.

    The reliability over a 30-day continuous operating period is

    R(30

    X

    24)

    =

    0.78286. The

    design life for a reliability of 0.95 specification is (-In 0.95)/0.00034 = 150.86 hr

    Memorylessness

    A

    well-known

    characteristic

    of the CFR

    model,

    one

    not

    shared

    by

    other

    failure

    distributions, is its lack of memory. That is, the time to failure of a component is

    not

    dependent

    on

    how

    long

    the component

    has been operating. There is no

    aging

    or

    wearout effect. The probability that the

    component

    will

    operate

    for

    the next

    1000 hi-

    is the

    same

    regardless of

    whether

    the

    component

    is

    brand

    new, has

    been

    operating

    for several

    hundred

    hours, or

    has been

    operating for several

    thousand

    hours.

    This

    property

    is consistent

    with

    the

    completely

    random and independent nature

    of

    the

    failure process. For

    example,

    when external,

    random environmental

    stresses

    are the

    primary

    cause

    of failures, the failure or operating history of

    the component

    will not

    he relevant.

    This property

    can

    be demonstrated mathematically using conditional reliability.

    I;rom Eq. (2.1

    R(t iTo) = R(t + To) _ e--).(t+T

    o

    )

    -

    R(To)

    e-

    M

    t

    e- = R(t)

    In

    other words, a

    bum-in period 10 has

    no

    subsequent effect on

    reliability

    and

    will

    not improve the component's reliability.

    T:me

    to failure

    depends only

    on

    the

    length

    01

    h l ~ observed operating

    time (I)

    and not

    on

    its

    current

    age

    (To).

    \ 1

    1,'i\lUJRE MOll1:'"

    ,"ll1l1linl!

    th\.· tU/; l!d ;,Je Itlllt '\! '

    11

    all failure modes, as shown below.

    Let

    Ai t)

    be the failure rate function for the

    ilh

    failure I11()J.:

    TI1l.'11

    1

    RI(t) ex

    p

    [ A,1/)l l t ' \

    (I

    I

    )

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    I:X ·.u ...U : J.2.

    BATHTUB

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    14/18

    1

    exp [ -

    [ :0

    A(t )dt ]

    ]

    r

    T

    +

    1

    R(t To) = = exp -

    A(t )dt

    exp [ -   [°

    A(t')

    dt ] ,To

    R(t) = ex

    p

    [ - f

    A(t )dt ]

    To+t

    il

    Then

    A(t )dt

    =

    A(t )dt

    J

    o

    0

    which requires

    A(t) =

    A, a constant. Therefore if failures are detennined by com

    pletely random independent events not associated with the age of the system, a con

    stant failure rate model will result.

    3.3.1 Renewal Process

    Assume that a system is comprised of many components acting independently and in

    such a way that an individual component failure causes a system failure. A renewal

    process, in which a failed component is immediately replaced with a new one, will

    cause the system to reach a steady-state, constant number

    of

    failures per unit

    of

    time.

    This is best illustrated by a numerical example.

    EXAMPLE 3.5. Consider the following discrete failure distribution for each of 1000

    identical components.

    n

    Pr{T n} 15

    for n = 1,2,3,4,5

    where T represents the number

    of

    operating cycles until failure. The number

    of i l u r c ~

    (and hence replacements

    each

    cycle) is shown in Table 3.1. Since each component is

    identical,

    MTTF;

    15 + 2 fs )+

    +

    + 5 J..)

    5 3

    where MTTF; is the mean time

    (number of

    operating cycles) to failure for the ith comp('

    nent.

    The

    system mean time between failures is (Il/3)/lOOO

    =

    0.0036667, and a steady·

    state failure rate

    of

    110.0036667

    =

    272.7 failures per cycle is observed. In general, for

    a renewal process in which failed components are replaced as they fail, a steady-srate

    c')nstant failure rate A is obtained such that

    A=

    ;=1 MTTF;

    Renewal processes will be discussed further in Chapter 9.

    3.3.2 Repetitive Loading

    If there is a small constant probability of failure

    p

    as a result of a load or stress being

    placed on the system and

    if

    independent loads are applied at constant, fixed intervals

    'I'.\IU.\I.

    l.1

    SYHtem renewalll

    . . . . . . . . . . . . . . . . . . . . . . . . . .

    __ - - - - - - - - - - ~ - - . ~ 4 J - - - - - - ~ m l.. -.---

    ( yde

    Number of l l u ~ s

    fs(lOOO) = 67

    is(lOOO) + -(s(67) "" 138

    .

    2

    rs(lOOO) +

    fs(67)

    +

    -(s(l38) = 218

    4

    ~ ( l O O O ) + fs(67) + is   I38) + -(s(218)

    =

    313

    5

    ~ ( 1 0 0 0 ) +

    ~ ( 6 7 )

    + rs(138) + i s ~ 2 1 8 ) + -(s(313) 429

    6

    ~ ( 6 7 )

    +

    ~ ( 1 3 8 )

    +

    1«218)

    +

    1\(313)

    +

    -/s(429) '"

    173

    7

    rs(138) +

    ~ ( 2 1 8 )

    + f:i(313) + 1\(429) + M173) 235

    Continuing in this manner:

    Number of failures

    Cycle

    Number

    of failures

    Cycle

    271

    18

    8 281

    274

    19

    9 303

    271

    20

    10 294

    272

    21

    II 236

    275

    22

    12 269

    274

    23

    13 283

    273

    24

    14 281

    273

    25

    15

    271

    27326

    16 263

    17 275

    A steady-state constant rate

    of

    273 failures per cycle is reached by the 24th

    III

    lime, an approximate exponential reliability function r e s u l t s ~ Let

    R

    l

    p),

    thl' reliability

    of

    a single load. Then

    Rn l t en1n 1-p)

    i'i

    the reliability given n loads. Since

    6

    1nO - p) = p for very small p,

    np

    Rn

    = e-

    Lei n =

    tlat, with at being the fixed time between loads. Then

    R(t) = e- plD..I)1 = e -

    AI

    with A

    =

    plat, a constant failure rate.

    A similar result is obtained if the loads are applied at random if thl: number

    of

    loads per time period

    hilS a Poisson distribution.

    "This follows from a first-order Taylor series approximation around the origin;

    i

    e., fix) In(l

    x)

    I(()+ xf (Q) = O+x - I )

    =

    -x .

    DM

    : . ioe ualifit

    M h h r ~

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    .LLl Reliability Rounds

    Even when the CFR model does not apply, it can still be used to provide bounds

    on system reliability provided the system hazard rate can

    be

    bounded. Assume

    that

    0<

    AL ; A(t) ; Au

    Then L

    L dt' ;

    J A(t')

    dl' ;

    f;

    Au dt'

    and expl -

    J

    ALdt']

    expl

    L

    (t')dt'] expl

    L

    ~ d t l ]

    e-

    ALt Aut

    or

    R t)

    (3. 11)

    Therefore if the hazard rate function is bounded, the reliability function can also be

    bounded.

    The

    exponential, because

    of

    its ~ o n s t a n t failure rate, provides a boundary be

    tween distributions having decreasing failure rates and those having increasing fail

    ure rates. Barlow and Proschan [1967] develop the following upper and lower relia

    bility bounds for when the hazard rate is decreasing and increasing, respectively. In

    addition to knowing that the process has an

    IFR

    or DFR, one must know the mean

    time

    to

    failure. For a

    DFR

    process,

    e-t lMTfF

    t MTTF

    (3.12)

    R(t):::;

    {

    M T T F e ~ t > MTTF

    For

    an

    IFR process,

    R t) { ~ - t I M T I F

    t < MTTF

    (3.13)

    t

    MTTF

    They also develop the following upper bound for when the hazard rate is in

    creasing.

    t

    ; MTTF

    (3.14)

    R t) :::;

    { -WIMTfF

    t>

    MTTF

    where

    1 - wMTTF

    =

    e-

    wt

    In order for the above equation to be satisfied, a different (tJ must be found for

    each t

    EXA

    MPLE 3.6.

    A government specification calis for a mechanical pump to have an

    MTIF of

    1000 operating hours. These pumps exhibit continuous wearout and there

    fore have an IFR. As a result, lower and upper bounds on the pump's reliability after

    200 operating hours are given by 0.8187 ;

    R 2oo)

    1. For 2000 operating "ours,

    o R 2000):::; 0.2032, where w was found to be 0.0007968 by solving Eq. (3.14)

    numerically with I = 2000.

    It XA tot ru : l .7.

    The l'oUuwinll J\\lIllhlhly functilln' has DFR and has

    IIIl MTI P

    of 400.

    R(t) t' jti2(-.J

    ('umpllring the aclual reliability III the upper bound computed using

    Eq.

    (3.12):

    Upper bound

    R(t)

    0.9753

    0.7996

    0.8825

    0

    0.6060

    0.7780

    0

    0.4930

    0.6065

    00

    0.3678

    0.4723

    00

    0.2938

    0.3679

    00

    400 0.243

    0.294

    0.2057

    0C

    0.245

    0.1769

    600

    J.4

    TilE

    TWO-PARAMETER EXPONENTIAL DISTRIBUTION

    If a failure will never occur prior to some specified time

    to,

    then to is a minimum,

    or threshold, time. t is also known as the guaranteed lifetime. The parameter

    to

    is

    II

    IOl:ation

    parameter that shifts the distribution

    an

    amount equal to to to the right

    nil

    the time (horizontal) axis. This is equivalent to rewriting the density function by

    Il'placing t with

    t

    _

    to,

    with the domain of the random variable now t to· Fo ' the

    ('xponential distribution, the probability density function becomes

    (3.15)

    dR t -

    -

      (t):=

    =

    Ae A t to) 0 < to

    ;

    t < 00

    dt

    alltl the reliability function will take

    on

    the following form:

    (3.16)

    R t) = e-A(t-

    tu)

    t to

    From

    Eqs.

    (3.15)

    and

    (3.16)

    the failure rate is

    A(t) =

    (t)/R(t)

    A

    However, the

    mean of the distribution is no longer

    II

    A but is shifted a distance to along the taxis.

    l Jsing integration by parts or formula 6 in Appendix 2E:

    1

    (3.17)

    MTIF =

    A t e - · ~ t - t o )

    dt to + -

    A

    The median of the distribution is obtained by solving Eq. (3.16) for tmed,

    (3.18)

    R(tmed) = e -A tmed-10)

    =

    0.5

    anu obtaining

    InO.5

    0.69315 (3.19)

    tmed = to + to +

    A

    IThis is a Weibuil i "liability function. The Wcibull distribution will be discussed in following chaptel.

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    Tilt' tit'sign lift' tH for II spl'l.:ifIL'd desigll reliability R can he obtainl'd III the SHllIl'

    lllaUller as Ihl' median lime. Therefore,

    InR

    fR =

    to

    + (3.20)

    -A

    The

    variance and standard deviation

    of

    the two-parameter exponential distribution

    are not affected

    by

    the location parameter. Therefore [f =

    IIA. The

    mode

    OCCurs

    at to.

    EXAMPLF.

    3.8.

    Let A

    0.00]

    and to

    = 200.

    Then

    R t)

    2

    and

    MIT

    - I _ 0.69315 893

    F -

    200 + 0.00

    I

    1200 tmed - 200 + o:om _

    J.

    0.95 3 I 1000

    to.95 =

    200 In 0.001 =

    25L

    u 6.001

    3.5

    POISSON PROCESS

    If a component having a constant failure rate A is immediately repaired or replaced

    upon failing, the

    number of

    failures observed over a time period

    t

    has a Poisson

    distribution.

    The

    probability

    of

    observing n failures in time

    t

    is given by the Poi:;son

    probability mass function

    Pn t):.

    e-At(AW

    Pn(t)

    n.

    r n

    0,1,2,.. .

    (3.21)

    Unlike the failure distribution that is continuous

    over

    time, the POIsson distribution

    1s

    discrete.

    The

    mean or expected

    number of

    failures over time

    t

    is given by At, and

    the variance of

    the distribution is also

    At.

    Equation (3.21) can be derived by first letting

    Y

    k

    Ti

    where

    T

    i ,

    a random variable, is the time between failure I and failure

    i

    and

    has

    an exponential distribution with

    parameter A.

    Therefore

    Yk

    is a random variable,

    the time of the

    kth

    failure. Since the sum

    of k

    independent exponential random vari

    ables has a

    gamma

    distribution

    8

    with parameters k and

    A

    the cumulative distribution

    function for Y

    k

    can be written as

    S

    A proof of this result

    may

    be

    found in

    many statistics texts, e.g.,

    Ross

    [1987, pp. 114-1l7

    J.

    Since k is

    :In

    integer, this

    is

    a special ease of the gamma distribution known a"

    the

    Erlang distribution.

    II

    i, only

    Ih,s

    special case that results in a closed-form

    expression

    for the

    CDF.

    FyY = 1

    t

    At   (A!l!

    (3.22)

    Prj YA .

    tl

    ''---'

    ·0 /.

    The

    cumulative rrobabilit y given by Eq. (3.22) is the probabilhy that

    the

    kth failure

    WIll occur

    by

    time

    t. The

    mean value for Y

    k

    is kIA, and the variance is k1A2.

    The

    mode is k 1)/,1. We have

    Pn(t)

    = Pr{Y

    n

    $

    t}

    -

    Pr{Y

    nJ

    $

    t} Fyn(t) -- Fyn+,(t)

    I ~ u a t i o n (3.21) follows from the above and from Eq. (3.22).

    The

    relationship between the two probability distributions can also be seen by

    determining the probability

    of

    no failures occurring in time

    t,

    which is equivalent to

    Pr{T

    2::

    t}.

    That

    is,

    e-At At)O

    Po t)

    =

    e-

    A

    = R t)

    The Poisson process is often used in inventory analysis to determine the number

    of

    spare components when the time between failures is exponential.

    For

    exallll:\e.

    if S spare components are available to support a continuous operation over a time

    period

    t

    then

    s

    Rs t)

    = L

    Pn t)

    (3.23)

    11=0

    is the cumulative probability of

    S Of

    fewer failures occurring during time

    t.

    Equa

    tion (3.23) therefore represents the probahility

    of

    satisfying all demands

    fOf

    spare

    components during time

    t.

    Therefore, Rs t) is the component reliability if there are

    S

    spares available for immediate replacement when a failure occurs.

    EXAMPLE 3.9.

    A specially designed welding machine has a nonrepairable motor with

    a constant failure rate of

    0.05

    failure per year. The company has purchased two spare

    motors. f the design life

    of

    the welding machine is

    10

    yr, what is the probability that the

    two spares will be adequate?

    Solution.

    The expected number

    of

    failures over the life

    of

    the machine

    is At

    0.05(10) = 0.5. From Eq. (3.23),

    R (l0) ± - O = ? 5 1 l e

    0.5

    I + 0.5 + 0.25 .= 0.9856

    2

    n O

    n.

    is

    the probability of 2 or fewer failures occurring over the

    10

    yr.

    Let Y, be the time

    of

    the third failure. Y

    3

    has a gamma distribution with k

    and

    A

    0.05.

    Therefore, the expected. or mean, time

    10

    obtain

    3

    failures

    is 3/0.05

    60 yr. The probability that the third failure will occur within

    10

    yr is obtained ffilm

    Eq. (3.22):

    I

    +

    0.05 x

    10 +

    (0.05 x

    1 0 } C , ~

    0.0144

    FY, IO) = I

    C

    .•

    serve that 0.0144 0.9S56 since the prnbabi

    lilY of

    two or fewer

    f a i l u r e ~

    i'l 10

    yr is cornplc1TltCntary 10 the event that the third failure occurs within 10 yr.

    3

    .1.6

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    3.6

    3.7

    3.8

    3.9

    A landing gear system has repetitive stresses placed on it twice a day as a result of

    landings. The probability of a failure during landing is 0.0028. Determine the

    of the landinl I ear system over a 30-day contingency operation. What is the probability

    10

    and 20 of the operation?

    A system contains 20 identical and critical components that will

    be

    replaced on failure

    (renewal process). As a result, a constant failure rate for the system will be observed.

    f

    a design life of

    IO

    yr with a reliability of 0.99 is required, what should the system MTTF

    and median time to failure be?

    If

    each component has a CFR, what will the component

    MTTF and median time to failure be?

    Two identical and CFR comput ers are

    reliability is to be 0.95 at 3000

    for each computer.

    Specifications for a power unit consisting of three independent and serial ly related com

    ponents(failure modes) require a design life of 5 yr with a

    0.95 reliability.

    Let each component have a constant failure rate such that the fir,t component's rate

    is

    twice that of the second and the third component's rate

    is

    three times that of the

    second. What should be the MTTF of each component and the system?

    (b) If two identical power units are placed in parallel, what is the system reliability at

    5

    yr,

    and what

    is

    the system MTTF?

    3.10 The time to failure of fluorescent lights in a large office building is expunentiady di,,· .

    tributed with a failure rate

    of

    0.03125

    hr.

    How many spare tubes must the hullding

    custodian maintain to have at least a 0.95 probability of replacing

    11::

    failures

    on

    a given

    Assume continuous 24-hour use of the lights.

    3.11

    J.12

    A l1ashlight contains

    two

    batteries each having an MITF of 5 operating hours (assume

    CFR).

    (a) What

    is

    the probability of battery failure occurring within the first 2 hr

    of

    operation'

    (b) If failed batteries are immediately replaced, what

    is the probability

    of

    mor than

    one failure occurring during the first 5 hr

    of

    operation?

    (c) Would

    you

    expect batteries to have a constant failure rate?

    Consider two redundant components having constant but different failure rates.

    Derive the reliability function and the MITE

    (b) Find the reliability at 1000 hr and the MTTF o f a two-component redundant systc

    where

    A1(t)

    0.000356 per hour andA2(t) 0.00156 per hour.

    3.13 An electronic circuit board with

    A t)

    0.00021 per hour replaced on failure. What

    is the probability that the third failure will occur by 10000 hours?

    3.14 In reliability testing it is of interest to know how long the test must run in order to

    generate a specified number of failures. A new condenser fan motor is believed

    to

    have

    a constant failure rate of

    3.4 failures per 100 operating hours. A single test stand is

    to

    be used

    in

    which a motor is operated until failure and then replaced with a new motor

    from oroduction. What is the expected test time if

    IO

    failures are desired?

    month" and t r.llul'l

    r t

    IIr 0.1 f"i1l1rr

    prr

    yellr. Whlll i the N y ~ l e l l l rdinhililY fur

    10,000 hr of continuaUII 0JHIrllllnn'/

    ~ 1 6

    \)erive u general

    expreNlIlll1l for

    R t) and the MTIF for the two-component system de

    N ~ ~ r i h c d

    in Exercise

    ? t I ~

    ~ 1 7 A microwave link in a communications network has a high failure rate. Although sev

    eral pieces of equipment have been used

    in

    the link, the link always seems to fail at

    IIhout the same rate regardless of the age of the equipment and its prior maintenance

    In general, microwave transmissions are subject to fading. Selective fading oc

    curs when atmospheric conditions bend a transmission

    to

    the extent that signals reach

    Ihe receiver in slightly different paths. The merging paths can cause interference and

    acate

    data errors. Other channels in the microwave transmission are not affected

    by

    selective fading. Selective fading occurs when there is an electrical storm. Flat fading

    occurs during

    fog

    and when the surrounding ground is very moist. t is more serious

    since

    it

    may last several hours and affect surrounding channels. f during the current

    season, electrical storms occur about once every week and fog alerts are issued at the

    rate of one every two months, what ig the reliability of the link over a 24-hour period?

    What assumptions, if any, are necesgary?

    .\. 11 1

    A 60-watt outdoor lightbulb is advertised as navmg an average life MITF of 1000

    (operating) hours. However, experience has shown that it will also fail on demand an

    average of once every 120 cycles. A particular bulb is turned 011 once each evening for

    an average of

    10 hr.

    f it

    is

    desired to have a reliability of

    90

    percent, what is its design

    life in days?

    .ut A more general exponential reliability model may be defined by

    R t) = where a > \, b > 0

    and a and b are parameters to be determined. Find the hazard rate function, and show

    how this model is equivalent to R t)

    .UO Repet itive loading, A packaging machine (cartoner) in a food processing facility will

    with a constant probability of 0.005 per application (per carton). Twelve cans of

    coffee are combined into a single case for shipment to buyers. The production rate is

    30 cans of coffee every minute. What is the probability (reliability) of no jams during

    a I-hr production run?

    .'-21 For the reliability function R t) e ~ I I I O O O ) 2

    ,

    use Eqs. (3.13) and (3.14) and I;ompare the

    upper and lower bounds with the actual reliabiIities at

    100,200,500,800,

    1000,2000,

    5000, and 10,000 hr. This failure distribution has an IFR with an MITF of 1772.46.

    ".12

    Show for the exponential distribution that the residual mean life is II A egardless of the

    of time the system has been operating.