Beamline Instrumentationfor Precise Characterization
of X ray FELs
1
Makina YABASHIRIKEN SPring 8 Center (RSC), Beamline R&D Group
[email protected] 27, 2013 @New York
FEL13
SPring 8 Angstrom Compact free electron LAser
Contents
1. Introduction– Importance of x ray diagnostics
2. Photon diagnostics (I): pulse energy & transversephase space
3. Photon diagnostics (II): Longitudinal phase space4. Summary
2
Why are photon diagnostics important forXFEL facilities ?
• Photon beam is a final product of XFEL source to userexperiments– e.g. studies on X ray nonlinear interactions
• Photon beam contains a number of key information formachine operation– could be more accurate and robust than electrons
• Photon diagnostics become strong linkage betweenmachine and users
3MachineMachine UsersUsersPhoton
diagnosticsPhoton
diagnostics
Objective
1. X ray beam profiles in 6 D phase space• Total photon number (pulse energy)• Spatial profile, centroid• Wavefront/Angular divergence• Spectrum• Temporal profile• Arrival timing to external laser• Polarization
2. Key• Shot to shot (non average)• Nondestructive (for users)• Wide dynamic range (spontaneous to fully saturated x rays)
4Introduce experiences at SACLA
5
SACLA @SPring 8
Compact XFELConstruction: FY2006~2010First lasing: June 2011User Operation:March 2012~
Experimental Building
6
Beamline
7
EH4: Open hutch
SACLA SPring 8Exp. Facility
Laser booth(CPA, OPA)Power amp: ~ 3 TW
BL3
5 beamlines (final)Start with BL3 (XFEL) & BL1 (SX)
EH1: R&D, beamconditioning optics
EH2: Pump & Probe (CPA/OPA)w unfocused beam
EH3: 1 um focusing(Imaging/Non linear)
BL1
OH: Common optics& diagnostics
Common X ray optics anddiagnostics have beencentralized in Optics HutchExperimental stations provideonly basic infrastructure (e.g.,optical laser, focusing system)Empty space for various
experimental instruments
Comparison of BL design concept:SACLA vs. LCLS
8
Brand new machine with unknownelectron beam propertiesMitigate risks by introducingphoton diagnosticsUtilize X ray diagnostics in opticshutch for both machine and users
Machine can operate withmatured e diagnosticsX ray optics & diagnostics arelocated in every experimentalhutch (only for users)
from LCLS web page
9
X ray beamline (optics and photon diagnostics) played a key role forenabling quick lasing in two months
Nat. Photon 6, 540 (2012)
Example: Commissioning of SACLA
10
Precise ID tuning using beamline optics/diagnostics
Overlap between e and p beam with an accuracy of ~urad isrequiredE beam trajectory easily bends at the edges of undulator modulesP beam goes through along the e beam in the undulatorP beam can be used to monitor the e beam trajectory in each
undulator moduleCf. central cone of the undulator radiation
1/g= 1/16000 = 60 urad for 8 GeV
11
Key components for SACLA commissioning
DCM Si(111)High stability;UHV compatible(Ohashi et al.)
single sensorMPCCD(Hatsui et al)
12
Spatial profile of monochromaticspontaneous radiation
~1 mm
Angular diameter: ~10 uradCentroid: 1 urad
Profile of monochromatic spontaneous rad
Photon energy
2 2
2 2 1 12 cos 2 2 2Ru u
U
2 2
2 2 1 12 cos 2 2 2Ru u
T. Takashi et alPRST 12
Pulse Energy 0.4 mJ @10 keVPhoton energy range 4.5 to 15 keV Stability Intensity I/I < 10%
Pointing 3 ~7% of beam sizeRepetition rate 20 Hz (Max. 60 Hz)
13
SACLA: Summary of Performance
Contents
1. Introduction2. Photon diagnostics (I): pulse energy &
transverse phase space3. Photon diagnostics (II): longitudinal phase space4. Summary
14
15
Pulse energy measurement
Pulse to pulse, wide dynamic range w/o saturation
Ion chamber using gas ionizationsemi transparent in wide wavelength rangeabsolute measurementneed care to nonlinearityneed cost space for vacuum system
Foil based backscattering monitorsemi transparent above a few keVneed care to damage to foil
Calorimeterabsolute measurementdestructiveaverage measurement
16
Pulse energy diagnostics:Thin foil backscattering monitor
Geometry
X rays
y
Semi transparentfilm
Photodiode
x
y
U
L
D
R
Quadrant photodiodesHamamatsu, S3590 09t300 um, 10 x10 mm2
xxx IKIIIIKx
RL
RL
yyy IKIIIIKy
DU
DU
ComptonScattering
Slope: KxL R U DI I I I IIntensity
Position
Collaboration with LCLS
Tono et al., RSI 82, 023108 (2011)
CVD ”nano” DiamondSmooth Debye Scherrer ringSpeckle freeSemi transparent (>97%@10 keV)Wide d range (10 nJ ~ 10 mJ)
Application (1): Gain curve measurement
17
Lg ~ 2.3 m
Lg ~ 4.6 m (2011 autumn)
Linear ScaleLog Scale
18
Application (2)Routine monitoring at control room
Pulse energy (uJ)
Vertical position (um)
Horizontal position (um)
Application (III)Monitoring of Beamline Transmittance
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Mirror1
Mirror 2a(
Photon energy /keV
Pulse energy / J
Radiometer XGMD4.4 32.26 0.35 32.9 2.05.8 104.2 1.3 106.6 6.19.6 95.3 2.3 93.9 6.113.6 42.2 1.1 40.8 2.916.8 0.96 0.03 ---
20
“From Relative to Absolute”International Collaboration
20T. Tanaka et al., NIMA 659, 528 (2011).K. Tiedtke et al., JAP. 103, 94511 (2008).
Thin-foil monitor(SACLA)
Calorimeter(AIST)
RT-type:Worked!
Gas monitor detector(DESY/PTB)
Nov. 24, 2011
Max. Deviation = 3.3%Kato et al, Appl. Phys. Lett.101, 023503 (2012)
New portable calorimeter operatingat room temperature
RT-type (2013/4)Cryo-type (2011/11)
Saito san(AIST)
Tanaka, Saito et al, in preparationPush to commercially available device
Developed by AIST and RIKEN, tested on April 2013
Spatial Profile Diagnostics (I)
22
Ce:YAG (300 um t)high efficiency (~ 1 uJ/pls)destructiveCVD B doped diamond (30 um t)low efficiencysemi transparent (>97% for 10 keV)speckle free> Available as inline, routine monitors
Retractable screens Phosphor coupled MCP monitor
Very high efficiency to imagespontaneous radiationRoutine use for undulator
alignment in every two weeks
Spatial Profile & Pointing Stability
23
Temperature stabilization of injector section (2012 autumn)
July 25, 2012 Sep. 18, 2012
V40 um, H50 um
V10 um, H20 um
Spatial Profile Diagnostics (II)
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Slit/knife edge scanning methodStability ? (intensity/position)
1 um Focusing at EH3
-0.1
0.1
0.3
0.5
0.7
0.9
1.1
0 10 20 30 40 500
0.02
0.04
0.06
0.08
0.1
0.12
0 10 20 30 40 50
II0 I / I0
Wire position /a.u.
Sig
nal /
a.u.
Wire position /a.u.
First derivative
Yumoto et al Nature Photon. 7, 43 (2013)
25
Measurement of nano scale spotwith two stage focusing system
0.0
0.2
0.4
0.6
0.8
1.0
-600 -300 0 300 600
Inte
nsity
(arb
. uni
t)
Position (nm)
Beam profileWire scan profileGaussian 45nm(FWHM)
0.0
0.2
0.4
0.6
0.8
1.0
-600 -300 0 300 600In
tens
ity (a
rb. u
nit)
Position (nm)
Beam profileWire scan profileGaussian 55nm(FWHM)
Vertical direction Horizontal direction
45nm(FWHM)
55nm(FWHM)
X ray energy: 10keVMimura et al, in preparation
~1020 W/cm2
Beamline Optics & Diagnostics
Photodiode & Screen monitor x7intensity/profile
Gas Monitor x1
Thin-foil monitor x2
Mirror 1
Mirror 2a Mirror 2b
Monochromator
Slit
In-line spectrometer x1
Tono et al., New J Phys. 15, 083035 (2013)
Contents
1. Introduction2. Photon diagnostics (I): Intensity & transverse phase space3. Photon diagnostics (II): Longitudinal phase space4. Summary
27
28
70
60
50
40
30
20
10
0
2 (d
eg)
20181614121086
photon energy (keV)
Dia(111) Dia(220) Dia(311)
111
220
311
Spectral range 6~20 keV
MPCCD
XFEL
Thin Diamond film
Central wavelength monitor
phot
on e
nerg
y
shot number
300 eV
Inubushi sanDiffraction ring from CVD diamond
HighWavelength StabilityRoutinely Achieved
29
10.0
9.9
9.8
9.7
9.6
9.5
phot
on e
nerg
y (k
eV)
200150100500
shot number
E
XFEL 1D focusPulse energy < 10 uJ
S. M. Durbin, et al., X ray pump optical probe cross correlation studyof GaAs Nature Photonics 6, 111
Conduction band
Egap < EphotonAbsorption
Valence band
Egap > EphotonTransmission
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ArrivalTiming
Transient transmission of optical laser inducedwith X rays; Spatial decoding
Sato san (SACLA/U Tokyo)Ogawa san, Togashi san (SACLA)
10 keV X rays
Harmand et al, Nat. Photon 2013
Jitters and Resolution
Delay 0
Sato et al., in preparation Single shot image
Histogram of arrival timeTiming jitter: 130 fs (rms)
~ 10 fs resolution
Sorting
Shot
num
ber
900 um 2.1 ps
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• Transmission grating• Efficiency can be tuned from 0.1% to 40%• Install to optics hutch as a permanent component
Collaboration with Ch. David (PSI)
Si grating 300 nm p/1 um t
75020070150150
64015015070
GG GGGG G
G G G G G G G G G G GG
L
P
L
L L
L
P
L L
PL
PPL PLG
L
LPL
“From destructive to nondestructive”Branching with beam splitter
32
T mon.
Exp.
Pulse Energy 0.4 mJ @10 keVPhoton energy range 4.5 to 15 keV Stability Intensity I/I < 10%
Pointing 3 ~7% of beam sizeRepetition rate 20 Hz (Max. 60 Hz)Pulse duration ??Peak Power ??
33
Summary of Performance
Temporal profile/Pulse duration
THz streaking methodGrguraš et al, Nat Photon. 2012
ref. T CAV
Frequency domainTTF 2 PRL (2002)Shintake et al, Nat Photon (2008)
35
Temporal vs. Frequency
FT-10 0 100
20
40
60
80
Time (fs)
Pow
er (G
W) =6 fs
9750 9760 9770 9780 97900
1
2
3[ 10 11 ]
Photon energy (eV)
Phot
on fl
ux(p
hoto
ns/p
ls/0
.1%
b.w
.)
Temporal domain Frequency domain
-30 -20 -10 0 10 20 300
20
40
60
Time (fs)
Pow
er (G
W)
=30 fs
9700 9710 9720 9730 97400
0.5
1[ 10 12 ]
Photon energy (eV)
Phot
on fl
ux(p
hoto
ns/p
ls/0
.1%
b.w
.)
9715 9716 9717 9718 9719 97200
0.5
1
Photon energy (eV)
~100 meV
Resolution
Recent developments of single shotspectrometers
LCLS: Collimated beam +bent, thin crystal analyzer
D. Zhu et al, APL 101, 034103 (2012)
SACLA: Diverged beam (elliptical mirror) + flat,thick crystal analyzer
M. Yabashi et al, PRL 97, 084802 (2006)Y. Inubushi et al, PRL 109 144801 (2012)
10 keVUndulator
MPCCD camera
Si crystal
Elliptical mirror
SwissFEL: Grating
P. Karvinen et al, Opt. Lett. 37 5073 (2012)36
37
PrincipleDivergent beam+ Flat Crystal Analyzer+ Position Sensitive Detector
Flat crystalanalyzer
B
B
min
22 22
cot
cot 3.2 cos 4cot
B
B x B es B hkl hkl
c
EE
s r F dL v
focussize extinction
Detectorpixel size
Higher order reflection >higher resolution
Resolution
-40 -20 0 20 400
0.5
1
-40 -20 0 20 40
Position ( m)
FWHM =16.9 meV
Inte
nsity
(a.u
.)
Energy (meV)
Measured at SPring 8M. Yabashi et al, PRL97, 084802 (2006)
140x103
120
100
80
60
40
20
Inte
nsity
(a.u
.)
10.1010.0510.009.959.90
Photon energy (keV)
120
100
80
60
40
20
0
inte
nsity
(a.u
.)
-2 -1 0 1 2Relative photon energy (eV)
100 m
10 keVUndulator
MPCCD camera
Si crystal
Elliptical mirror
Si (555)Resolution :
~14 meV
Si (111)Resolution :
~1 eV
Inubushi san (SACLA)
Development at SACLA
38
39
Single shot spectra: wide range (~100 eV)with Si111
Spike profiles change in every shot due to SASE schemeBut central energy is stable
40
Single shot spectra: high resolution (14 meV)with Si 555
Bunch compressionSpike width in freq. domain
WeakNarrow
StrongBroad
Fourier relationship between temporal and frequency
Experiment
Simulation“SIMPLEX”
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E=600 meV (FWHM)E=290 meVE=110 meV
=31 fs =8.9 fs =4.5 fs (FWHM)
Y. Inubushi, et al, PRL. 109 144801 (2012).
Evaluation of pulse duration using XFEL simulation
E = 400 60 meV ~6.5 1.5 fs
300 uJ/pls (@ 10 keV) P > 40 GW
Recent operation condition (Jan 2013)
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Pulse Energy 0.3 mJ @10 keVPhoton energy range 4.5 to 15 keV Stability Intensity I/I < 10%
Pointing 3 ~7% of beam sizeRepetition rate 10 Hz (Max. 60 Hz)Pulse duration < 10 fsPeak Power > 40 GW
43
Summary of Performance
Note: recent nonlinear X ray experiment suggests shorter pulseduration (FWHM: 2.5 2.8 fs, Tamasaku et al, PRL 2013)Continue to develop new methods
Normalization of SASE spikes by comparingtwo spectra from +1 and 1 order Katayama san
(SACLA)
+1
1
Application (II): Dispersive Absorption Spectroscopy
Collaborated with Profs. Toshinori Suzuki (Kyoto U), Kazuhiko Misawa (TUAT)Kiyotaka Asakura (Hokkaido U) 44
2.1462.146 2.1362.1362.1312.131
2.1262.1262.1212.121
2.1172.1172.1402.140
• Zn thickness 20 m• 200 shots (one K value)• Observable range 30 ~ 40 eV
(one K value)• resolution ~0.4 eV200 shots (20 s) for measuringXAS with good S/N level
Dispersive X ray absorption spectrum
Katayama et al, APL, in press
10 shots100 shots
Static artifact
rms deviation = 0.9%
K value
45
Summary• Photon diagnostics are practically working for reliable and stable operation
of XFEL machine• Advanced diagnostics promote to develop user experimental methods• Close collaboration among machine, beamline, and control interface
people is essential
• Absolute pulse energy: easily measured with RT calorimeter• Spatial profile: screen based and edge scan based methods are available,
single shot high resolution method is demanded• Wavefront: grating interferometer shows excellent performance• Spectrum: high resolution below 20 meV with crystal spectrometer, useful
for seeded operation• Arrival timing: below 10 fs is possible• Pulse duration: still need to develop, especially below 10 fs region
Spectral spikes, THz streaking, auto/cross correlation w XNL
• Still a lot of exciting challenges. Your valuable inputs, proposals, andcollaboration are highly appreciated 46
AcknowledgementAll SACLA/SPring 8 MembersEspecially,Kensuke Tono, Tadashi Togashi, Yuichi Inubushi, Tetsuo Katayama, KanadeOgawa, Takaki Hatsui, Yasumasa Joti, Togo Kudo, Takashi Kameshima, YoichiKirihara, Shun Ono, Hiroaki Kimura, Hiromitsu Tomizawa, Haruhiko Ohashi,Hirokatsu Yumoto, Takahisa Koyama, Shunji Goto, Kenji Tamasaku, MitsuruNagasono, Kazuaki Togawa, Takashi Tanaka, Toru Hara, Hitoshi Tanaka,Ryotaro Tanaka, Mitsuhiro Yamaga, Toru Ohata, Yukito Furukawa, TakashiSugimoto, Hideo Kitamura, & Tetsuya Ishikawa
Yoshiro Fujiwara & Engineering TeamOsaka University
Yasuhisa Sano, Satoshi Matsuyama, Taito Osaka,Univ. of Tokyo
Hidekazu Mimura, Takahiro Sato, Ichiro Inoue
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Thank you for your attention
48
END
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